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2008 Photo Contest
Open to All Members of the Failure Analysis Community!
Share your best images with the failure analysis community and be recognized for creating them!
Sponsored by the Membership Committee of the Electronic Device Failure Analysis Society.
| Where: |
Selected entries will be displayed and prizes awarded November 2-6, 2008 at the International Symposium for Testing and Failure Analysis (ISTFA) Conference and Exposition in Portland, Oregon |
| Categories: |
No more than one submission allowed in each category.
I. Color Images Only
(Optical Microscopy)
II. Black & White Images Only
(Optical Microscopy/SEM/TEM/X-Ray/UV Micrographs)
III. False Color Images Only
(SPM/SAM/Photon emission/other)
Images will be judged on failure analysis relevance, aesthetics, and novelty (technique or mechanism).
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| Deadline: |
Entries must be submitted by August 15, 2008
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| Entries: |
Submit by email to photocontest@edfas.org
(Subject line: EDFAS Photo contest)
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| Format: |
Submissions should be made through e-mail only, with picture attached. Each submission must be in a standard format (PNG, JPEG, TIFF, BMP, etc.) The picture should be in native resolution and less than 10 MB.
Along with the picture, the email should include the name of submitter, category of submission, mailing address, phone, fax, e-mail address and a description of the micrograph (not exceeding 50 words). The picture should not have any contact information embedded.
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| Copyright and Permissions: |
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Entrants are responsible for obtaining any releases or any other permission or license necessary for the submission of their work for this contest and future publication. EDFAS and ASM will have the right to exhibit, reproduce and distribute in any manner any or all of the entries. The entries will not be returned to submitters.
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| Prizes: |
- 1st place in each category receives a wall plaque and one-year complimentary EDFAS membership
- 2nd and 3rd place in each category receives award certificate and one-year complimentary EDFAS membership
- The top 10 entries in each category will be displayed at ISTFA 2008, in Portland, Oregon
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